Dae-Young Kim and Kuk-Jin Yoon, “High Quality Depth Map Up-Sampling with Consideration for Edge Noise of Range Sensors,” IEEE International Conference on Image Processing (ICIP), 2012 (oral presentation).
Dae-Young Kim and Kuk-Jin Yoon, “High Quality Depth Map Up-Sampling with Consideration for Edge Noise of Range Sensors,” IEEE International Conference on Image Processing (ICIP), 2012 (oral presentation). – Author : Dae-Young Kim and Kuk-Jin Yoon – Published Date : September 30, 2012 – Category : Etc. – Place of publication : IEEE International Conference on Image Processing…